Reflectometers

SOC-410 Series

Portable contact measurement devices designed to take precise and accurate measurements. 

SOC-100 HDR

Hemispherical Directional Reflectometer providing polarized, angular reflectance measurement from 10° to 80° incident angles.

Coupled to the Nicolet FTIR, the SOC-100 HDR works in the entire spectral region available for that FTIR.

It provides the capabilities to measure the collimated and scattered transmittance of samples, and by using a specular beam blocker, the diffuse and specular partition of the scattered energy. From the direct measurements other values can be calculated: directional and near normal emissivity, directional angular emissivity, total hemispherical emissivity, solar absorptance, and optical constants (ns and ks).

Features
 

  • All measurement functions are fully automated, insuring excellent productivity for busy labs
     

  • The SOC-100 HDR and application software provide a powerful set of tools for many engineering applications.
     

  • ASTM E408

SOC-210 BRDF

The SOC-210 Bidirectional Reflectometer is a precision laboratory instrument designed for mapping bidirectional reflectance distribution functions (BRDF) of surfaces, paints, coatings, liquids, and particles.

BRDF data gives engineers the necessary information to adequately solve problems requiring precision information about the direction and magnitude of energy scattered from a surface.

The SOC-210 BDR measures the BRDF of samples from the ultraviolet to infrared spectral range (including visible) using an assortment of interchangeable sources, spectral bandpass filters, and detectors. Complete hemispherical coverage is obtained by varying both incident polar and azimuth angles and reflected polar and azimuth angles.

Several new features have been added to its already extensive list of capabilities. These include an automated bandpass filter wheel that is capable of holding up to twenty different bandpass filters. This allows the user to take multispectral BRDF data over twenty different wavelengths during a single measurement run. Previously, the user had been limited to a single wavelength per measurement. Support for new sterling cycle cooled MCT and InSb detectors allow the instrument to collect unattended BRDF data continuously over several days.

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Enformatic Systems Sp. z o.o.
ul. Mieszka I 73B
35-303 Rzeszow
Poland

NIP / VAT-UE: PL813-38-14-444

REGON: 383440788

KRS: 0000787396

Sąd Rejonowy w Rzeszowie
XII Wydział Gospodarczy

Kapitał Zakładowy: 70 000 PLN